MRS develops and produces a number of custom hardware and software modules for semiconductor wafer metrology companies including:

• Electromagnetic deflection amplifiers and column control modules for E-Beam wafer inspection systems
• High frequency column drivers for direct write E-beam systems
• High frequency, low noise trans-impedance amplifier, data acquisition system for wafer inspection systems
• Electrostatic deflection amplifiers and column control modules for multicolumn E-Beam wafer inspection system
• Front-end electronics and data acquisition system for bare wafer inspection system